Quartz CL/SEM measurement, e- beam, Luff & Townsend 1990

Measurement details

Reference Luff & Townsend 1990
Luff B. J. & Townsend P. D. (1990). Cathodoluminescence of synthetic quartz. Journal of Physics: Condensed Matter, 2(40), 8089-8097. DOI: https://doi.org/10.1088/0953-8984/2/40/009
Material Quartz [ SiO2 ]
Specimen temperature Ambient
Technique Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Probe Electron beam
Lines Defect 380 nm, 440 nm, 510 nm, Oxygen vacancy 650 nm

Composition

Nominal composition of Quartz [ SiO2 ].
Element Atoms At% Wt%
Si 1 33.3 46.7
O 2 66.7 53.3