Quartz CL/SEM measurement, e- beam, Luff & Townsend 1990
Measurement details
Reference | Luff & Townsend 1990 Luff B. J. & Townsend P. D. (1990). Cathodoluminescence of synthetic quartz. Journal of Physics: Condensed Matter, 2(40), 8089-8097. DOI: https://doi.org/10.1088/0953-8984/2/40/009 |
Material | Quartz [ SiO2 ] |
Specimen temperature | Ambient |
Technique | Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM) |
Probe | Electron beam |
Lines | Defect 380 nm, 440 nm, 510 nm, Oxygen vacancy 650 nm |
Composition
Element | Atoms | At% | Wt% |
---|---|---|---|
Si | 1 | 33.3 | 46.7 |
O | 2 | 66.7 | 53.3 |