Quartz CL/SEM measurement, e<sup>-</sup> beam, Luff & Townsend 1990

Quartz CL/SEM measurement, e^- beam, Luff & Townsend 1990

Reference	Luff & Townsend 1990 Luff B. J. & Townsend P. D. (1990). Cathodoluminescence of synthetic quartz. Journal of Physics: Condensed Matter, 2(40), 8089-8097. DOI: https://doi.org/10.1088/0953-8984/2/40/009
Material	Quartz [ SiO₂ ] Rutilated quartz specimen, from Ibitiara, Bahia, Northeast Region, Brazil. Size: 6.6 x 5.5 x 5.1 cm. © Rob Lavinsky, iRocks.com – CC-BY-SA-3.0
Specimen temperature	Ambient
Technique	Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Probe	Electron beam
Lines	Defect 380 nm, 440 nm, 510 nm, Oxygen vacancy 650 nm

Nominal composition of Quartz [ SiO₂ ].
Element	Atoms	At%	Wt%
Si	1	33.3	46.7
O	2	66.7	53.3