Zirconia (var. nanocrystals) PL/XL measurement, 40 kV W anode x-ray beam, Smits et al. 2011
Measurement details
Reference | Smits et al. 2011 Smits K., Grigorjeva L., Millers D., Sarakovskis A., Grabis J. & Lojkowski W. (2011)., 131(10), 2058-2062. https://doi.org/10.1016/j.jlumin.2011.05.018 |
Material | Zirconia (var. nanocrystals) [ ZrO2 ] |
Specimen temperature | Ambient |
Technique | X-ray photoluminescence |
Probe | 40 kV W anode x-ray beam |
Anode current | 10 mA |
Detector name | Andor 303i-B spectrometer with Andor DU-401A-BV camera |
Det. technology | Charge-coupled device (CCD) |
Lines | Intrinsic defect 2.52 eV, 2.49 eV |
Composition
Element | Atoms | At% | Wt% |
---|---|---|---|
Zr | 1 | 33.3 | 74 |
O | 2 | 66.7 | 26 |