Zircon CL/SEM measurement, e- beam, 205K, Cesbron et al. 1995

Measurement details

Reference Cesbron et al. 1995
Cesbron F., Blanc P., Ohnenstetter D. & Remond G. (1995). Cathodoluminescence of rare earth doped zircons. I. Their possible use as reference materials. Scanning Microscopy. Supplement., 9, 35-56.
https://digitalcommons.usu.edu/microscopy/vol1995/iss9/3/
Material Zircon [ ZrSiO4 ]
Specimen temperature 205K
Technique Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Probe Electron beam
Lines
  • Dy3+ 485 nm (100%), 580 nm (100%), 665 nm, 755 nm, 840 nm
  • Er3+ 325 nm (100%), 405 nm (100%), 480 nm (100%), 530 nm, 550 — 560 nm, 620 nm
  • Eu3+ 595 nm (100%), 560 nm, 620 — 635 nm, 710 nm (100%)
  • Gd3+ 315 nm (100%), 630 nm
  • Ho3+ 550 nm (100%), 660 — 670 nm (100%), 760 nm (100%)
  • Intrinsic 230 nm, 290 nm, 310 nm, 330 nm, 355 nm, 380 nm
  • Sm3+ 610 — 620 nm (100%), 575 nm, 655 — 670 nm, 725 nm
  • Tb3+ 385 nm (100%), 415 nm, 440 nm, 490 nm (100%), 590 nm, 625 nm, 675 nm, 765 nm, 835 nm
  • Tm3+ 345 — 360 nm (100%), 455 — 480 nm (100%), 510 — 520 nm, 650 — 665 nm, 700 nm, 730 nm, 790 — 800 nm

Composition

Nominal composition of Zircon [ ZrSiO4 ].
Element Atoms At% Wt%
Zr 1 16.7 49.8
Si 1 16.7 15.3
O 4 66.7 34.9