Silicon SXES spectrum, 5 keV e- beam, CSIRO 2016
Measurement details
| Description | SXES spectrum of Silicon |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://research.csiro.au/microbeam-lab/ |
| Date measured | 2016-09-26 |
| Material | Silicon [ Si ] |
| Specimen | Si LE2-3 [CSIRO] |
| Related specimen | P-0310 Silicon [CSIRO]. ex Ian Madsen. Supposedly pure |
| Technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 99.9 nA |
| Grating | 50XL |
| Acquisition time | 640 s |
| Channel count | 2048 |
| Energy range | 46.8109 … 170.472 eV |
| Intensity range | 216.813 … 39699.6 counts |
| Integral | 6.8147×106 counts |
Measurement spectrum
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Measurement image
SXES spectrum of Silicon
© (C) 2016 CSIRO Mineral Resources