Quartz CL/SEM measurement, e- beam, Grant & White 1978

Measurement details

Reference Grant P. R. & White S. H. (1978). Cathodoluminescence and microstructure of quartz overgrowths on quartz.. Scanning Electron Microscopy, 1, 789-794.
Material Quartz [ SiO2 ]
Specimen temperature Ambient
Technique Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Probe Electron beam
Lines Oxygen orbitals? 400 nm, Oxygen vacancy 620 nm, 650 nm

Composition

Nominal composition of Quartz [ SiO2 ].
Element Atoms At% Wt%
Si 1 33.3 46.7
O 2 66.7 53.3