Zircon (var. Tm doped) PL/Laser spectrum, 473 nm laser beam, Lenz et al. 2015

Measurement details

Description PL/Laser spectrum of Zircon (var. Tm doped)
Reference Lenz et al. 2015
Lenz C., Nasdala L., Talla D., Hauzenberger C., Seitz R. & Kolitsch U. (2015). Laser-induced REE3+ photoluminescence of selected accessory minerals — An “advantageous artefact” in Raman spectroscopy. Chemical Geology, 415, 1-16. https://doi.org/10.1016/j.chemgeo.2015.09.001
https://www.sciencedirect.com/science/article/pii/S000925411530022X
Material Zircon (var. Tm doped) [ ZrSiO4:Tm ]
Technique Laser photoluminescence (PL)
Instrument Horiba LabRam HR Evolution
Probe 473 nm laser beam
Det. technology CCD, Si, Peltier cooled
Grating spacing 600 lines/mm
Numerical aperture 0.9
Channel count 9079
Energy range 1.31446 … 2.6087 eV
Intensity range 100 (normalised intensity)
Lines Tm3+ 2.56906 eV (100%), 2.60539 eV (40.5%), 2.5622 eV (29.6%), 1.85544 eV (18%), 1.86789 eV (12.5%), 1.8938 eV (31%), 1.88956 eV (18.1%), 1.90045 eV (6%), 1.91579 eV (32.7%), 1.95364 eV (4.7%), 1.93206 eV (9.9%), 1.92847 eV (2.7%), 1.93605 eV (1.8%), 1.98427 eV (1.4%), 1.9675 eV (0.6%), 1.88113 eV (2.3%), 1.56775 eV (37.6%), 1.57193 eV (5.8%), 1.55359 eV (14.3%), 1.55088 eV (3.3%), 1.52949 eV (2.8%), 1.58698 eV (9.2%), 1.59785 eV (8.8%), 1.59342 eV (3.9%), 1.64508 eV (1.8%), 1.6309 eV (1.3%)

Composition

Nominal composition of Zircon (var.Tm doped) [ ZrSiO4:Tm ].
Element Atoms At% Wt%
Zr 1 16.7 49.8
Si 1 16.7 15.3
O 4 66.7 34.9

Measurement spectrum

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