Zircon (var. Tm doped) PL/Laser spectrum, 473 nm laser beam, Lenz et al. 2015
Measurement details
Description | PL/Laser spectrum of Zircon (var. Tm doped) |
Reference | Lenz et al. 2015 Lenz C., Nasdala L., Talla D., Hauzenberger C., Seitz R. & Kolitsch U. (2015). Laser-induced REE3+ photoluminescence of selected accessory minerals — An “advantageous artefact” in Raman spectroscopy. Chemical Geology, 415, 1-16. https://doi.org/10.1016/j.chemgeo.2015.09.001 https://www.sciencedirect.com/science/article/pii/S000925411530022X |
Material | Zircon (var. Tm doped) [ ZrSiO4:Tm ] |
Technique | Laser photoluminescence (PL) |
Instrument | Horiba LabRam HR Evolution |
Probe | 473 nm laser beam |
Det. technology | CCD, Si, Peltier cooled |
Grating spacing | 600 lines/mm |
Numerical aperture | 0.9 |
Channel count | 9079 |
Energy range | 1.31446 … 2.6087 eV |
Intensity range | 100 (normalised intensity) |
Lines | Tm3+ 2.56906 eV (100%), 2.60539 eV (40.5%), 2.5622 eV (29.6%), 1.85544 eV (18%), 1.86789 eV (12.5%), 1.8938 eV (31%), 1.88956 eV (18.1%), 1.90045 eV (6%), 1.91579 eV (32.7%), 1.95364 eV (4.7%), 1.93206 eV (9.9%), 1.92847 eV (2.7%), 1.93605 eV (1.8%), 1.98427 eV (1.4%), 1.9675 eV (0.6%), 1.88113 eV (2.3%), 1.56775 eV (37.6%), 1.57193 eV (5.8%), 1.55359 eV (14.3%), 1.55088 eV (3.3%), 1.52949 eV (2.8%), 1.58698 eV (9.2%), 1.59785 eV (8.8%), 1.59342 eV (3.9%), 1.64508 eV (1.8%), 1.6309 eV (1.3%) |
Composition
Element | Atoms | At% | Wt% |
---|---|---|---|
Zr | 1 | 16.7 | 49.8 |
Si | 1 | 16.7 | 15.3 |
O | 4 | 66.7 | 34.9 |
Measurement spectrum
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