Hafnium SXES spectrum, 5 keV e- beam, CSIRO 2016
Loading...
Measurement details
| Description | SXES spectrum of Hafnium |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://spectroscopy.csiro.au/sxes |
| Date measured | 2016-10-20 |
| Material | Hafnium [ Hf ] |
| Analysis technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 100 nA |
| Det. technology | CCD, Si, Peltier cooled |
| Grating | 200N |
| Acquisition time | 240 s |
| Channel count | 2048 |
| Energy range | 49.7705 … 184.838 eV |
| Intensity range | -6 … 513 counts |
| Integral | 116110 counts |
Specimen details
| Name | Hf METM-32 |
| Owner | CSIRO |
| Other measurements | Hafnium SXES spectrum, 5 keV e- beam, CSIRO 2016 |
Specimen image
BSE image of Hafnium [Hf] in 'Hf METM-32' standard (CSIRO). Instrument: JEOL JXA-8530F. Date: July 2025.
(C) 2025 CSIRO Mineral Resources. All rights reserved.