Jadeite CL/SEM measurement, 15 keV e- beam, Takahashi et al. 2017
Measurement details
Reference | Takahashi et al. 2017 TAKAHASHI N., TSUJIMORI T., KAYAMA M. & NISHIDO H. (2017). Journal of Mineralogical and Petrological Sciences, 112(5), 291-299. DOI: https://doi.org/10.2465/jmps.170403 |
Material | Jadeite [ NaAlSi2O6 ] |
Technique | Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM) |
Instrument | JEOL JSM-5410 |
Probe | 15 keV electron beam |
Beam current | 0.7 nA |
Detector name | Oxford Instruments MonoCL2 |
Det. technology | Photomultiplier |
Lines | Al3+ 320 nm, 360 nm, Lattice defect 700 nm |
Composition
Element | Atoms | At% | Wt% |
---|---|---|---|
Na | 1 | 10 | 11.4 |
Al | 1 | 10 | 13.3 |
Si | 2 | 20 | 27.8 |
O | 6 | 60 | 47.5 |