Zircon (var. Ho doped) PL/Laser spectrum, 532 nm laser beam, Lenz et al. 2015
Measurement details
| Description | PL/Laser spectrum of Zircon (var. Ho doped) |
| Reference | Lenz et al. 2015 Lenz C., Nasdala L., Talla D., Hauzenberger C., Seitz R. & Kolitsch U. (2015). Laser-induced REE3+ photoluminescence of selected accessory minerals — An “advantageous artefact” in Raman spectroscopy. Chemical Geology, 415, 1-16. https://doi.org/10.1016/j.chemgeo.2015.09.001 https://www.sciencedirect.com/science/article/pii/S000925411530022X |
| Material | Zircon (var. Ho doped) [ ZrSiO4:Ho ] |
| Technique | Laser photoluminescence (PL) |
| Instrument | Horiba LabRAM HR |
| Probe | 532 nm laser beam |
| Det. technology | CCD, Si, Peltier cooled |
| Grating spacing | 600 lines/mm |
| Numerical aperture | 0.9 |
| Channel count | 8934 |
| Energy range | 1.24749 … 2.31784 eV |
| Intensity range | 100 (normalised intensity) |
| Lines | Ho3+ 1.62784 eV (7.3%), 1.62967 eV (5.9%), 1.62883 eV (2.6%), 1.6321 eV (3.6%), 1.63279 eV (16.3%), 1.63555 eV (6.5%), 1.63696 eV (16.7%), 1.64089 eV (5.8%), 1.64553 eV (56.5%), 1.64655 eV (11.8%), 1.64761 eV (11.5%), 1.65775 eV (2.7%), 1.65886 eV (3.2%), 1.86238 eV (16.1%), 1.86973 eV (22.3%), 1.86829 eV (10.1%), 1.87291 eV (52%), 1.89299 eV (9.1%), 1.89963 eV (49.8%), 1.90405 eV (13.9%), 1.90695 eV (11.7%), 1.91334 eV (27.1%), 1.9166 eV (7.5%), 1.91829 eV (7.8%), 1.91985 eV (21.9%), 1.92265 eV (3.7%), 1.92495 eV (2.4%), 1.92957 eV (4%), 1.93381 eV (5.2%), 1.93717 eV (1.6%), 1.88182 eV (5.7%), 2.24676 eV (30.1%), 2.24807 eV (7.3%), 2.23711 eV (9.5%), 2.26206 eV (10.8%), 2.26877 eV (32.9%), 2.27641 eV (90.2%), 2.27186 eV (23.9%), 2.27335 eV (44.2%), 2.27968 eV (18.2%), 2.28662 eV (100%), 2.29081 eV (19.2%), 2.29293 eV (14.2%), 2.29506 eV (46.2%), 2.29721 eV (89%), 2.29833 eV (79.9%), 2.30295 eV (43.4%), 2.30426 eV (30.6%), 2.30584 eV (28.3%), 2.30923 eV (20.7%), 2.31289 eV (22.3%), 2.26016 eV (2.3%), 2.24294 eV (5.1%) |
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Zr | 1 | 16.7 | 49.8 |
| Si | 1 | 16.7 | 15.3 |
| O | 4 | 66.7 | 34.9 |
Measurement spectrum
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