Quartz (var. synthetic) CL/SEM measurement, 30 keV e<sup>-</sup> beam, 80-295K, Stevens-Kalceff & Phillips 1995

Quartz (var. synthetic) CL/SEM measurement, 30 keV e^- beam, 80-295K, Stevens-Kalceff & Phillips 1995

Reference	Stevens-Kalceff & Phillips 1995 Stevens-Kalceff M. A. & Phillips M. R. (1995). Cathodoluminescence microcharacterization of the defect structure of quartz. Phys Rev B Condens Matter, 52(5), 3122-3134. DOI: https://doi.org/10.1103/physrevb.52.3122
Material	Quartz (var. synthetic) [ SiO₂ ]
Specimen temperature	80-295K
Analysis technique	Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Instrument	JEOL JSM-35C
Probe	30 keV electron beam
Beam current	250 nA
Probe diameter	0.6 μm
Detector name	Oxford Instruments MonoCL
Det. technology	Photomultiplier
Grating spacing	1200 lines/mm
Lines	AlO4 3.12 eV Extrinsic 2.46 eV Intrinsic 2.93 eV NBOHC 1.91 eV, 1.95 eV, 1.88 eV, 1.95 eV Self trapped exciton 2.28 eV, 2.69 eV, 2.72 eV, 2.68 eV

Nominal composition of Quartz (var.synthetic) [ SiO₂ ].
Element	Atoms	At%	Wt%
Si	1	33.3	46.7
O	2	66.7	53.3
Total	3	100	100