Tin SXES spectrum, 5 keV e- beam, CSIRO 2016
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Measurement details
| Description | SXES spectrum of Tin |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://spectroscopy.csiro.au/sxes |
| Date measured | 2016-10-20 |
| Material | Tin [ Sn ] |
| Analysis technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 100 nA |
| Grating | 200N |
| Acquisition time | 256 s |
| Channel count | 2048 |
| Energy range | 49.7705 … 184.838 eV |
| Intensity range | -21 … 554 counts |
| Integral | 126445 counts |
Specimen details
| Name | Sn METM-29 |
| Owner | CSIRO |
| Other measurements | Tin SXES spectrum, 5 keV e- beam, CSIRO 2016 |
Specimen image
BSE image of Tin [Sn] in 'Sn METM-29' standard (CSIRO). Instrument: JEOL JXA-8530F. Date: July 2025.
(C) 2025 CSIRO Mineral Resources. All rights reserved.
Measurement image
SXES spectrum of Tin
(C) 2016 CSIRO Mineral Resources