Zircon SXES spectrum, 5 keV e- beam, CSIRO 2016
Measurement details
| Description | SXES spectrum of Zircon |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://research.csiro.au/microbeam-lab/ |
| Date measured | 2016-09-26 |
| Material | Zircon [ ZrSiO4 ] |
| Specimen | ZrSiO4 HyperII-31 [CSIRO] |
| Related specimen | P-0319 Zircon [CSIRO]. Synthetic 'Zero Standard' crystals. Does not contain U or Th |
| Technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 99.9 nA |
| Grating | 50XL |
| Acquisition time | 640 s |
| Channel count | 2048 |
| Energy range | 46.8109 … 170.472 eV |
| Intensity range | 433.227 … 16509.6 counts |
| Integral | 2.6454×106 counts |
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Zr | 1 | 16.7 | 49.8 |
| Si | 1 | 16.7 | 15.3 |
| O | 4 | 66.7 | 34.9 |
Measurement spectrum
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Measurement image
SXES spectrum of Zircon
© (C) 2016 CSIRO Mineral Resources