Tantalum(V) oxide SXES spectrum, 5 keV e- beam, CSIRO 2016
Measurement details
| Description | SXES spectrum of Tantalum(V) oxide |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://research.csiro.au/microbeam-lab/ |
| Date measured | 2016-09-27 |
| Material | Tantalum(V) oxide [ Ta2O5 ] |
| Specimen | Ta2O5 HyperI-34 [CSIRO] |
| Related specimen | P-0309 Ta2O5 [CSIRO]. Fused powder (Material was 99.99 % pure) |
| Technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 99.9 nA |
| Grating | 50XL |
| Acquisition time | 640 s |
| Channel count | 2048 |
| Energy range | 46.8109 … 170.472 eV |
| Intensity range | 101.954 … 3777.9 counts |
| Integral | 1.0357×106 counts |
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Ta | 2 | 28.6 | 81.9 |
| O | 5 | 71.4 | 18.1 |
Measurement spectrum
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Measurement image
SXES spectrum of Tantalum(V) oxide
© (C) 2016 CSIRO Mineral Resources