Quartz (var. synthetic) PL/XL measurement, 50 kV W anode x-ray beam, 80-300K, Alonso <i>et al.</i> 1983

Quartz (var. synthetic) PL/XL measurement, 50 kV W anode x-ray beam, 80-300K, Alonso et al. 1983

Reference	Alonso et al. 1983 Alonso P. J., Halliburton L. E., Kohnke E. E. & Bossoli R. B. (1983). X‐ray‐induced luminescence in crystalline SiO2. Journal of Applied Physics, 54(9), 5369-5375. DOI: https://doi.org/10.1063/1.332715
Material	Quartz (var. synthetic) [ SiO₂ ]
Specimen temperature	80-300K
Analysis technique	X-ray photoluminescence
Probe	50 kV W anode x-ray beam
Anode current	30 mA
Detector name	Spex monochromator with RCA C31034 photomultiplier
Det. technology	Photomultiplier
Lines	AlO4 3.26 eV, {{linesearch:7220d03a-9a8a-432b-994b-d495e3d53a5d\|Unknown}}: 2.82 eV, 2.92 eV

Nominal composition of Quartz (var.synthetic) [ SiO₂ ].
Element	Atoms	At%	Wt%
Si	1	33.3	46.7
O	2	66.7	53.3
Total	3	100	100