Tantalum SXES spectrum, 5 keV e- beam, CSIRO 2016
Measurement details
| Description | SXES spectrum of Tantalum |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://research.csiro.au/microbeam-lab/ |
| Date measured | 2016-09-28 |
| Material | Tantalum [ Ta ] |
| Specimen | Ta METM-33 [CSIRO] |
| Related specimen | METM25-44 block [CSIRO]. Astimex metal standard mount, 25mm |
| Technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 59.8 nA |
| Grating | 50XL |
| Acquisition time | 640 s |
| Channel count | 2048 |
| Energy range | 46.8109 … 170.472 eV |
| Intensity range | 40.251 … 1040.28 counts |
| Integral | 594373 counts |
Measurement spectrum
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Measurement image
SXES spectrum of Tantalum
© (C) 2016 CSIRO Mineral Resources