Zinc sulphide CL/SEM measurement, 5 keV e- beam, Hichou et al. 2004
Measurement details
| Reference | Hichou et al. 2004 Hichou A. E., Addou M., Bubendorff J. L., Ebothé J., Idrissi B. E. & Troyon M. (2004). Microstructure and cathodoluminescence study of sprayed Al and Sn doped ZnS thin films. Semiconductor Science and Technology, 19(2), 230-235. DOI: https://doi.org/10.1088/0268-1242/19/2/018 |
| Material | Zinc sulphide [ ZnS ] |
| Specimen temperature | Ambient |
| Technique | Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM) |
| Instrument | LEO-GEMINI 982 FEG-SEM |
| Probe | 5 keV electron beam |
| Detector name | Jobin Yvon Triax 190 spectrometer |
| Det. technology | CCD, LN2 cooled |
| Lines | Band gap 399 nm, Donor-acceptor pair 490 nm, 524 nm, Unknown 430 nm, 600 nm, Various 405 nm |
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Zn | 1 | 50 | 67.1 |
| S | 1 | 50 | 32.9 |