Zinc sulphide CL/SEM measurement, 5 keV e- beam, Hichou et al. 2004

Measurement details

Reference Hichou et al. 2004
Hichou A. E., Addou M., Bubendorff J. L., Ebothé J., Idrissi B. E. & Troyon M. (2004). Microstructure and cathodoluminescence study of sprayed Al and Sn doped ZnS thin films. Semiconductor Science and Technology, 19(2), 230-235. DOI: https://doi.org/10.1088/0268-1242/19/2/018
Material Zinc sulphide [ ZnS ]
Specimen temperature Ambient
Technique Cathodoluminescence (CL), using a Scanning Electron Microscope (SEM)
Instrument LEO-GEMINI 982 FEG-SEM
Probe 5 keV electron beam
Detector name Jobin Yvon Triax 190 spectrometer
Det. technology CCD, LN2 cooled
Lines Band gap 399 nm, Donor-acceptor pair 490 nm, 524 nm, Unknown 430 nm, 600 nm, Various 405 nm

Composition

Nominal composition of Zinc sulphide [ ZnS ].
Element Atoms At% Wt%
Zn 1 50 67.1
S 1 50 32.9