Zircon (var. Nd doped) PL/Laser spectrum, 785 nm laser beam, Lenz et al. 2015
Measurement details
| Description | PL/Laser spectrum of Zircon |
| Reference | Lenz et al. 2015 Lenz C., Nasdala L., Talla D., Hauzenberger C., Seitz R. & Kolitsch U. (2015). Laser-induced REE3+ photoluminescence of selected accessory minerals — An “advantageous artefact” in Raman spectroscopy. Chemical Geology, 415, 1-16. https://doi.org/10.1016/j.chemgeo.2015.09.001 https://www.sciencedirect.com/science/article/pii/S000925411530022X |
| Material | Zircon (var. Nd doped) [ ZrSiO4:Nd ] |
| Technique | Laser photoluminescence (PL) |
| Instrument | Horiba LabRam HR800 |
| Probe | 785 nm laser beam |
| Det. technology | CCD, Si, Peltier cooled |
| Grating spacing | 600 lines/mm |
| Numerical aperture | 0.9 |
| Channel count | 7697 |
| Energy range | 1.05403 … 1.56719 eV |
| Intensity range | 100 (normalised intensity) |
| Lines | Nd3+ 1.1397 eV (6.5%), 1.14272 eV (25.7%), 1.15511 eV (21.8%), 1.16027 eV (82.8%), 1.16223 eV (44.4%), 1.17559 eV (21.7%), 1.17753 eV (36.3%), 1.18754 eV (2.7%), 1.3219 eV (5.8%), 1.33428 eV (21.3%), 1.34952 eV (13.3%), 1.3636 eV (8.6%), 1.35943 eV (1.7%), 1.38281 eV (8.5%), 1.39007 eV (17.6%), 1.39903 eV (18.7%), 1.39999 eV (17.5%), 1.40896 eV (100%), 1.42428 eV (83.4%), 1.43244 eV (8.6%) |
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Zr | 1 | 16.7 | 49.8 |
| Si | 1 | 16.7 | 15.3 |
| O | 4 | 66.7 | 34.9 |
Measurement spectrum
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