Zircon (var. Sm doped) PL/Laser spectrum, 473 nm laser beam, Lenz <i>et al.</i> 2015

Zircon (var. Sm doped) PL/Laser spectrum, 473 nm laser beam, Lenz et al. 2015

Description	PL/Laser spectrum of Zircon (var. Sm doped)
Reference	Lenz et al. 2015 Lenz C., Nasdala L., Talla D., Hauzenberger C., Seitz R. & Kolitsch U. (2015). Laser-induced REE3+ photoluminescence of selected accessory minerals — An “advantageous artefact” in Raman spectroscopy. Chemical Geology, 415, 1-16. https://doi.org/10.1016/j.chemgeo.2015.09.001 https://www.sciencedirect.com/science/article/pii/S000925411530022X
Material	Zircon (var. Sm doped) [ ZrSiO₄:Sm ] Zircon specimen from Alta, Finnmark, Norway © Photo by Penland, via Smithsonian National Museum of Natural History
Technique	Laser photoluminescence (PL)
Instrument	Horiba LabRam HR Evolution
Probe	473 nm laser beam
Det. technology	CCD, Si, Peltier cooled
Grating spacing	600 lines/mm
Numerical aperture	0.9
Channel count	9114
Energy range	1.31219 … 2.60918 eV
Intensity range	100 (normalised intensity)
Lines	Sm³⁺ 1.70265 eV (7.5%), 1.71778 eV (24.2%), 1.72635 eV (9.2%), 1.74556 eV (3.7%), 1.7647 eV (5.3%), 1.74326 eV (4%), 1.77005 eV (3.4%), 1.77718 eV (1.4%), 1.86411 eV (18.2%), 1.87892 eV (36.2%), 1.89389 eV (7.1%), 1.90587 eV (21.8%), 1.91846 eV (6.2%), 2.01397 eV (59.2%), 2.05107 eV (100%), 2.0218 eV (23.9%), 2.08145 eV (8.1%), 2.09495 eV (10.5%), 2.0867 eV (17.3%), 2.14906 eV (11%), 2.16684 eV (16.3%), 2.18364 eV (35.7%), 2.2052 eV (8.2%), 2.2103 eV (8.3%), 2.2183 eV (7.2%), 2.222 eV (6.5%)

Nominal composition of Zircon (var.Sm doped) [ ZrSiO₄:Sm ].
Element	Atoms	At%	Wt%
Zr	1	16.7	49.8
Si	1	16.7	15.3
O	4	66.7	34.9