Results for Intrinsic defect in Quartz [SiO2]

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Emitter Position Measurement Technique Temperature Reference
Intrinsic defect 175.0nm … CL/SEM Ambient Richter et al. 2003
Intrinsic defect 290.0nm … CL/SEM Ambient Richter et al. 2003
Intrinsic defect 340.0nm … CL/SEM Ambient Richter et al. 2003
Intrinsic defect 420.0nm … CL/SEM Ambient Richter et al. 2003
Intrinsic defect 450.0nm … CL/SEM Ambient Richter et al. 2003
Intrinsic defect 580.0nm … CL/SEM Ambient Richter et al. 2003