Plagioclase [(Na,Ca)[(Si,Al)AlSi2]O8]

Units:
References:
Emitter Position Measurement Technique Temperature Reference
Mn2+ 208.7nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 239.3nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 248.3nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 284.6nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 295.4nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 305.6nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 321.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 340.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 355.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 404.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 421.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 487.0nm CL/OM Ambient Telfer & Walker 1978
Mn2+ 559.0nm CL/OM Ambient Telfer & Walker 1978