Quartz [SiO2]

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Material Emitter Position Measurement Technique Reference
Quartz, igneous Oxygen vacancy? 280.0nm (40.0 nm FWHM) — — Rink et al. 1993
Quartz, igneous Unspecified 330.0nm — — Rink et al. 1993
Quartz, granitic (H4O4)0 360.0 - 380.0nm — — Rink et al. 1993
Quartz (H3O4)0 hole traps 380.0nm — — Rink et al. 1993
Quartz, granitic Unspecified 420.0 - 435.0nm — — Rink et al. 1993
Quartz, pegmatitic (AlO4)0 hole traps 470.0nm (55.0 nm FWHM) — — Rink et al. 1993
Quartz, hydrothermal Unspecified 560.0 - 580.0nm — — Rink et al. 1993
Quartz, hydrothermal Oxygen vacancy 580.0nm (220.0 nm FWHM) — — Rink et al. 1993
Quartz, volcanic phenocrysts Unspecified 620.0 - 630.0nm — — Rink et al. 1993