NoneQuartz [SiO2]

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Spectrum Line Material Emitter Position Measurement Technique Temperature Reference
Quartz Ti4+ 448.0nm … CL Ambient Torpy et al. 2020
— — Quartz Defect 450.0nm … CL/SEM Ambient Holness & Watt 2001
— — Quartz Intrinsic defect 450.0nm … CL/SEM Ambient Richter et al. 2003
— — Quartz Ti4+ 456.0nm (140.0 nm FWHM) … CL Ambient Vasyukova et al. 2013
— — Quartz Ti4+ 458.0nm (140.0 nm FWHM) … CL Ambient Leeman et al. 2012
— — Quartz, pegmatitic (AlO4)0 hole traps 470.0nm (55.0 nm FWHM) — — — Rink et al. 1993
— — Quartz Defect 470.0nm (140.0 nm FWHM) … CL/SEM 40K Luff & Townsend 1990
Quartz Self trapped exciton 471.6nm (157.0 nm FWHM) … CL/SEM Ambient CSIRO CL spectra 2011
— — Quartz Self trapped exciton 480.0nm — — — Trukhin & Plaudis 1979
— — Quartz Self trapped exciton 480.0nm — — — Remond et al. 1992
— — Quartz Unspecified 481.0nm — — — Gritsenko & Lisitsyn 1985
— — Quartz [AlO4|M+]- center 500.0nm … CL/SEM Ambient Richter et al. 2003
— — Quartz, metamorphic Unspecified 505.0nm … CL Ambient Preusser et al. 2009
— — Quartz Unspecified 505.0nm … CL/SEM Ambient Holness & Watt 2001
— — Quartz Defect 510.0nm (200.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990