Quartz [SiO2]

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Emitter Position Measurement Technique Temperature Reference
Defect 380.0nm (120.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990
Defect 440.0nm (120.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990
Defect 470.0nm (140.0 nm FWHM) … CL/SEM 40K Luff & Townsend 1990
Defect 510.0nm (200.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990
Defect 570.0nm (200.0 nm FWHM) … CL/SEM 40K Luff & Townsend 1990
Oxygen vacancy 650.0nm (140.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990