NoneQuartz [SiO2]

Units:
References:
Clear spectra choices
Hide lines
Plot in window
Related Materials:
Spectrum Line Material Emitter Position Measurement Technique Temperature Reference
— — Quartz Unspecified 560.0nm — — — Remond et al. 1992
— — Quartz, hydrothermal Unspecified 560.0 - 580.0nm — — — Rink et al. 1993
— — Quartz Defect 570.0nm (200.0 nm FWHM) … CL/SEM 40K Luff & Townsend 1990
— — Quartz, hydrothermal Unspecified 575.0nm … CL Ambient Preusser et al. 2009
— — Quartz, hydrothermal Oxygen vacancy 580.0nm (220.0 nm FWHM) — — — Rink et al. 1993
— — Quartz Intrinsic defect 580.0nm … CL/SEM Ambient Richter et al. 2003
— — Quartz Unspecified 585.0nm … CL/SEM Ambient Holness & Watt 2001
— — Quartz Unspecified 605.0nm — — — Gritsenko & Lisitsyn 1985
— — Quartz Oxygen vacancy 620.0nm (140.0 nm FWHM) … CL/SEM Ambient Grant & White 1978
— — Quartz Unspecified 625.0nm … CL/OM Ambient Moore & Karakus 1994
— — Quartz, volcanic phenocrysts Unspecified 620.0 - 630.0nm — — — Rink et al. 1993
— — Quartz NBOHC 620.0 - 650.0nm … CL/SEM Ambient Richter et al. 2003
Quartz NBOHC 639.0nm (142.0 nm FWHM) … CL Ambient Torpy et al. 2020
Quartz Oxygen vacancy 644.7nm (140.0 nm FWHM) … CL/SEM Ambient CSIRO CL spectra 2011
— — Quartz Oxygen vacancy 650.0nm (140.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990