NoneAdularia [KAlSi3O8]

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Spectrum Line Emitter Position Measurement Technique Temperature Reference
— — Defect 293.0nm (43.0 nm FWHM) … CL Ambient Correcher and García-Guinea 2001
— — Defect 298.0nm (40.0 nm FWHM) … PL/XL — Correcher and García-Guinea 2001
— — Defect 309.0nm (57.0 nm FWHM) — — — Correcher and García-Guinea 2001
— — Lattice defect 363.0nm (58.0 nm FWHM) … PL/XL — Correcher and García-Guinea 2001
— — Lattice defect 375.0nm (65.0 nm FWHM) … CL Ambient Correcher and García-Guinea 2001
— — Lattice defect 379.0nm (62.0 nm FWHM) — — — Correcher and García-Guinea 2001
— — Al-O- -Al 424.0nm (80.0 nm FWHM) … CL Ambient Correcher and García-Guinea 2001
— — Al-O- -Al 428.0nm (68.0 nm FWHM) — — — Correcher and García-Guinea 2001
— — Al-O- -Al 433.0nm (77.0 nm FWHM) … PL/XL — Correcher and García-Guinea 2001
— — Ti4+ 468.0nm (69.0 nm FWHM) — — — Correcher and García-Guinea 2001
Ti4+ 472.3nm (159.0 nm FWHM) … CL/SEM Ambient CSIRO CL spectra 2016
— — Ti4+ 475.0nm (97.0 nm FWHM) … CL Ambient Correcher and García-Guinea 2001
— — Ti4+ 476.0nm (78.0 nm FWHM) … PL/XL — Correcher and García-Guinea 2001
Ti4+ 482.1nm (153.0 nm FWHM) … CL/SEM Ambient CSIRO CL spectra 2011
— — Mn2+ 542.0nm (92.0 nm FWHM) — — — Correcher and García-Guinea 2001