NoneAdularia [KAlSi3O8]

Units:
References:
Spectra to be plotted: 1
Lines to be plotted: 3
Spectrum Line Emitter Position Measurement Technique Temperature Reference
Defect 293.0nm (43.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Defect 298.0nm (40.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Defect 309.0nm (57.0 nm FWHM) Correcher and García-Guinea 2001
Lattice defect 363.0nm (58.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Lattice defect 375.0nm (65.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Lattice defect 379.0nm (62.0 nm FWHM) Correcher and García-Guinea 2001
Al-O- -Al 424.0nm (80.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Al-O- -Al 428.0nm (68.0 nm FWHM) Correcher and García-Guinea 2001
Al-O- -Al 433.0nm (77.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Ti4+ 468.0nm (69.0 nm FWHM) Correcher and García-Guinea 2001
1 Ti4+ 472.3nm (159.0 nm FWHM) CL/SEM Ambient CSIRO CL spectra 2016
Ti4+ 475.0nm (97.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Ti4+ 476.0nm (78.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Ti4+ 482.1nm (153.0 nm FWHM) CL/SEM Ambient CSIRO CL spectra 2011
Mn2+ 542.0nm (92.0 nm FWHM) Correcher and García-Guinea 2001