Results for Defect in Adularia [KAlSi3O8]

Units:
References:
Emitter Position Measurement Technique Temperature Reference
Defect 293.0nm (43.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Defect 298.0nm (40.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Defect 309.0nm (57.0 nm FWHM) Correcher and García-Guinea 2001