Results for Lattice defect in Adularia [KAlSi3O8]

Units:
References:
Emitter Position Measurement Technique Temperature Reference
Lattice defect 363.0nm (58.0 nm FWHM) PL/XL Correcher and García-Guinea 2001
Lattice defect 375.0nm (65.0 nm FWHM) CL Ambient Correcher and García-Guinea 2001
Lattice defect 379.0nm (62.0 nm FWHM) Correcher and García-Guinea 2001