Results for Oxygen vacancy in Quartz [SiO2]

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Spectrum Line Material Emitter Position Measurement Technique Temperature Reference
— — Quartz, hydrothermal Oxygen vacancy 580.0nm (220.0 nm FWHM) — — — Rink et al. 1993
— — Quartz Oxygen vacancy 620.0nm (140.0 nm FWHM) … CL/SEM Ambient Grant & White 1978
1 Quartz Oxygen vacancy 644.7nm (140.0 nm FWHM) … CL/SEM Ambient CSIRO CL spectra 2011
— — Quartz Oxygen vacancy 650.0nm (140.0 nm FWHM) … CL/SEM Ambient Luff & Townsend 1990
— — Quartz Oxygen vacancy 650.0nm (140.0 nm FWHM) … CL/SEM Ambient Grant & White 1978